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Focus Session: Advanced CMOS and 5.5D Packaging: Perspectives and Challenges for Design, Reliability and Security

par Amrouch, Hussam;Milojevic, Dragomir ;Di Natale, Giorgio;Toublanc, Jérôme
Référence Proceedings - Design, Automation, and Test in Europe Conference and Exhibition
Publication Publié, 2026-04-20

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Résumé :

AI workloads are driving exceptional demand for performance and energy efficiency, forcing semiconductor innovation to advance along two major directions simultaneously. On the device roadmap, the transition from FinFETs to gate-all-around nanosheet FETs and, subsequently, monolithic 3D Complementary FETs (CFETs) is enabling scaling toward the 2 nm era and beyond while targeting aggressive logic density. In parallel, advanced packaging, spanning 2.5D integration on silicon interposers, true 3D stacking, and hybrid 5.5D assemblies, is becoming essential to deliver ultra-high bandwidth, low-energy die-to-die connectivity required by rapidly growing AI model sizes and the resulting memory-wall bottlenecks. This focus session discusses the opportunities and challenges of this co-evolution, with emphasis on system-technology co-optimization and the inevitable need for multiphysics analysis across electrical, thermal, mechanical, and reliability domains. We highlight how reliability and security concerns are increasingly shaping architectural and packaging choices, and we discuss the role of deep learning as a practical enabler for faster simulation and design-space exploration under rising complexity.