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Joint rate and power density analysis in Manhattan environments: (a comparison of) stochastic geometry and ray-tracing approaches

par Demey, Simon;Wiame, Charles;Oestges, Claude ;De Doncker, Philippe
Référence (08-11 February, 2022: Bologna, Italy), Proc. of the European Cooperation in Science and Technology (EURO-COST CA20120 TD(22)01063)
Publication Publié, 2022-02

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Résumé :

The proposed work tries to quantify how relevant it is to use a deterministic channel model likeray tracing at a network deployment level in a Manhattan-like environment. More precisely, the goal isto compare it with simplier and more computationally efficient models to see if similar results can beobtained at a lower cost. In the framework of the analysis, ray tracing is thus compared to a stochasticgeometry-based model in terms of coverage probability and exposure at a centric user for which we wereable to derive semi-closed form expressions. In addition, a good lower bound for the joint coverage exposure distibution was found. In order to easily mimic the propagation mechanisms implementedin the UCLouvain RT software and enable fair comparison, the Berg recursive model was consideredas channel model. Finally, the analytical expressions were further enhanced to take into account theantenna height as well as the line-of-sight probability in the typical street and to distinguish a typicaluser located at a crossroad from a typical user located inside a street.