par Vanackere, Tom ;Vandekerckhove, Tom ;Bogaert, Laurens;Billet, Maximilien ;Poelman, Stijn;Cuyvers, Stijn;Kerrebrouck, Joris Van;Moerman, Arno;Caytan, Olivier;Lemey, Sam;Torfs, Guy ;Roelkens, Gunther;Clemmen, Stéphane ;Kuyken, Bart
Référence Conference on Lasers and Electro-Optics, CLEO 2023 Technical Digest Series, CLEO: Science and Innovations 2023, Optica Publishing Group, page (STh1R.1)
Publication Publié, 2023-05-17
Référence Conference on Lasers and Electro-Optics, CLEO 2023 Technical Digest Series, CLEO: Science and Innovations 2023, Optica Publishing Group, page (STh1R.1)
Publication Publié, 2023-05-17
Publication dans des actes
Titre: |
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Auteur: | Vanackere, Tom; Vandekerckhove, Tom; Bogaert, Laurens; Billet, Maximilien; Poelman, Stijn; Cuyvers, Stijn; Kerrebrouck, Joris Van; Moerman, Arno; Caytan, Olivier; Lemey, Sam; Torfs, Guy; Roelkens, Gunther; Clemmen, Stéphane; Kuyken, Bart |
Informations sur la publication: | Conference on Lasers and Electro-Optics, CLEO 2023 Technical Digest Series, CLEO: Science and Innovations 2023, Optica Publishing Group, page (STh1R.1) |
Statut de publication: | Publié, 2023-05-17 |
Sujet CREF: | Optique |
Mots-clés: | Bit error rate |
Extinction ratios | |
Lithium niobate | |
Silicon modulators | |
Silicon nitride | |
Thin films | |
Langue: | Français |
Identificateurs: | info:doi/10.1364/CLEO_SI.2023.STh1R.1 |