par Ellinidou, Soultana ;Sharma, Gaurav ;Markowitch, Olivier ;Gogniat, Guy;Dricot, Jean-Michel
Référence DFT(19-21 Oct. 2020: Frascati, Italy, Italy), 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), IEEE, Vol. 1, page (1-6)
Publication Publié, 2020-10-20
Référence DFT(19-21 Oct. 2020: Frascati, Italy, Italy), 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), IEEE, Vol. 1, page (1-6)
Publication Publié, 2020-10-20
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