par Ellinidou, Soultana 
;Sharma, Gaurav ;Markowitch, Olivier ;Gogniat, Guy;Dricot, Jean-Michel
Référence DFT(19-21 Oct. 2020: Frascati, Italy, Italy), 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), IEEE, Vol. 1, page (1-6)
Publication Publié, 2020-10-20
;Sharma, Gaurav ;Markowitch, Olivier ;Gogniat, Guy;Dricot, Jean-Michel Référence DFT(19-21 Oct. 2020: Frascati, Italy, Italy), 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), IEEE, Vol. 1, page (1-6)
Publication Publié, 2020-10-20
Publication dans des actes
| Titre: |
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| Auteur: | Ellinidou, Soultana; Sharma, Gaurav; Markowitch, Olivier; Gogniat, Guy; Dricot, Jean-Michel |
| Informations sur la publication: | DFT(19-21 Oct. 2020: Frascati, Italy, Italy), 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), IEEE, Vol. 1, page (1-6) |
| Statut de publication: | Publié, 2020-10-20 |
| Sujet CREF: | Sciences de l'ingénieur |
| Langue: | Français |
