par Gontier, Quentin ;Petrillo, Luca ;Nguyen, Trung-Hien ;Oestges, Claude ;Wiart, Joe JW;De Doncker, Philippe
Référence (11-13 March, 2020: Saclay, France), Actes des Journées Scientifiques URSI-France
Publication Publié, 2020-03
Publication dans des actes
Résumé : EMF exposure in Brussels, Belgium, is studied in the framework of stochastic geometry. Poisson point processes withrealistic intensity are randomly generated to model base stations. Electric field level at random location is deduced froma simple path loss law. Statistical results are compared to experimental data’s in order to optimize the model. Theimpact of network densification is analyzed and probabilities of exceeding exposure thresholds are derived.