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A digital oscilloscope setup for the measurement of a transistor's characteristic curves

par de Buyl, Pierre
Référence American journal of physics, 78, 12, page (1425-1429)
Publication Publié, 2010-12-01

Article révisé par les pairs

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Résumé :

Measuring the I-V characteristics of a transistor constitutes an important step in an introductory electronics course. We demonstrate the use of a digital oscilloscope with a USB connection to perform a measurement of the characteristic curves with no additional custom circuitry. The setup is presented alongside the open-source software that allows the signal acquisition and analysis of the results.