par Kraus, Stefan;Monnier, John J.D.;Ireland, M.~J.;Duchêne, Gaspard;Espaillat, C.;Hönig, S.;Juhasz, A.;Mordasini, C.;Olofsson, J.;Paladini, Claudia 
;Stassun, K.;Turner, Nils;Vasisht, G.;Harries, T.~J.;Bate, M.~R.;Gonzalez, J.-F.;Matter, A.;Zhu, Z.;Panic, O.;Regaly, Z.;Morbidelli, A.;Meru, F.;Wolf, S.;Ilee, J.;Berger, Jean-Philippe;Zhao, M.;Kral, Q.;Morlok, A.;Bonsor, A.;Ciardi, D.;Kane, S.~R.;Kratter, K.;Laughlin, Greg;Pepper, J.;Raymond, S.;Labadie, L.;Nelson, R.~P.;Weigelt, G.;Ten Brummelaar, Theo T.A.;Pierens, A.;Oudmaijer, R.;Kley, W.;Pope, B.;Jensen, E.~L.~N.;Bayo, A.;Smith, M.;Boyajian, Tabetha T.S.;Quiroga-Nuñez, L.~H.;Millan-Gabet, R.;Chiavassa, Andréa ;Gallenne, A.;Reynolds, Mark;De Wit, Willem Jan;Wittkowski, Markus;Millour, F.;Gandhi, Poshak R.;Ramos Almeida, C.;Alonso Herrero, A.;Packham, C.;Kishimoto, M.;Tristram, K.~R.~W.;Pott, J.-U.;Surdej, J.;Buscher, D.;Haniff, C.;Lacour, S.;Petrov, R.;Ridgway, S.~T.;Tuthill, P.;Van Belle, Gerard G.T.;Armitage, P.;Baruteau, C.;Benisty, M.;Bitsch, B.;Paardekooper, S.-J.;Pinte, C.;Masset, F.;Rosotti, G.
Référence Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series, Vol. 9907, page (99071), 9907
Publication Publié, 2016
;Stassun, K.;Turner, Nils;Vasisht, G.;Harries, T.~J.;Bate, M.~R.;Gonzalez, J.-F.;Matter, A.;Zhu, Z.;Panic, O.;Regaly, Z.;Morbidelli, A.;Meru, F.;Wolf, S.;Ilee, J.;Berger, Jean-Philippe;Zhao, M.;Kral, Q.;Morlok, A.;Bonsor, A.;Ciardi, D.;Kane, S.~R.;Kratter, K.;Laughlin, Greg;Pepper, J.;Raymond, S.;Labadie, L.;Nelson, R.~P.;Weigelt, G.;Ten Brummelaar, Theo T.A.;Pierens, A.;Oudmaijer, R.;Kley, W.;Pope, B.;Jensen, E.~L.~N.;Bayo, A.;Smith, M.;Boyajian, Tabetha T.S.;Quiroga-Nuñez, L.~H.;Millan-Gabet, R.;Chiavassa, Andréa ;Gallenne, A.;Reynolds, Mark;De Wit, Willem Jan;Wittkowski, Markus;Millour, F.;Gandhi, Poshak R.;Ramos Almeida, C.;Alonso Herrero, A.;Packham, C.;Kishimoto, M.;Tristram, K.~R.~W.;Pott, J.-U.;Surdej, J.;Buscher, D.;Haniff, C.;Lacour, S.;Petrov, R.;Ridgway, S.~T.;Tuthill, P.;Van Belle, Gerard G.T.;Armitage, P.;Baruteau, C.;Benisty, M.;Bitsch, B.;Paardekooper, S.-J.;Pinte, C.;Masset, F.;Rosotti, G.Référence Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series, Vol. 9907, page (99071), 9907
Publication Publié, 2016
Publication dans des actes
| Titre: |
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| Auteur: | Kraus, Stefan; Monnier, John J.D.; Ireland, M.~J.; Duchêne, Gaspard; Espaillat, C.; Hönig, S.; Juhasz, A.; Mordasini, C.; Olofsson, J.; Paladini, Claudia; Stassun, K.; Turner, Nils; Vasisht, G.; Harries, T.~J.; Bate, M.~R.; Gonzalez, J.-F.; Matter, A.; Zhu, Z.; Panic, O.; Regaly, Z.; Morbidelli, A.; Meru, F.; Wolf, S.; Ilee, J.; Berger, Jean-Philippe; Zhao, M.; Kral, Q.; Morlok, A.; Bonsor, A.; Ciardi, D.; Kane, S.~R.; Kratter, K.; Laughlin, Greg; Pepper, J.; Raymond, S.; Labadie, L.; Nelson, R.~P.; Weigelt, G.; Ten Brummelaar, Theo T.A.; Pierens, A.; Oudmaijer, R.; Kley, W.; Pope, B.; Jensen, E.~L.~N.; Bayo, A.; Smith, M.; Boyajian, Tabetha T.S.; Quiroga-Nuñez, L.~H.; Millan-Gabet, R.; Chiavassa, Andréa; Gallenne, A.; Reynolds, Mark; De Wit, Willem Jan; Wittkowski, Markus; Millour, F.; Gandhi, Poshak R.; Ramos Almeida, C.; Alonso Herrero, A.; Packham, C.; Kishimoto, M.; Tristram, K.~R.~W.; Pott, J.-U.; Surdej, J.; Buscher, D.; Haniff, C.; Lacour, S.; Petrov, R.; Ridgway, S.~T.; Tuthill, P.; Van Belle, Gerard G.T.; Armitage, P.; Baruteau, C.; Benisty, M.; Bitsch, B.; Paardekooper, S.-J.; Pinte, C.; Masset, F.; Rosotti, G. |
| Informations sur la publication: | Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series, Vol. 9907, page (99071), 9907 |
| Statut de publication: | Publié, 2016 |
| Sujet CREF: | Astrophysique |
| Langue: | Anglais |
| Identificateurs: | info:doi/10.1117/12.2231067 |
| info:scp/85006847126 |
