par Roose, N.;Ye, Min 
;Vereecken, Jean ;Seibt, EW
Référence Surface and interface analysis, 21, 6-7, page (474-482)
Publication Publié, 1994
;Vereecken, Jean ;Seibt, EWRéférence Surface and interface analysis, 21, 6-7, page (474-482)
Publication Publié, 1994
Article révisé par les pairs
| Résumé : | In this paper factor analysis applied on AES measurements is used in the study of the chemical composition of YBa2Cu3O7‐x superconductors. In the first part, YBa2Cu3O7‐x thin films deposited on MgO and SrTiO3 are investigated by AES depth profiling. Factor analysis makes it possible to identify secondary phases present at the surface and the interfaces. This method also offers the possibility of determining the real interface thickness, as the edges of pure film and pure substrate are more accurately defined. In the second part, the radiation induced effects of a 10 keV electron beam are investigated on YBa2Cu3O7‐x single crystals. Besides the stoichiometric changes the chemical changes in function of the radiation dose are studied. Factor analysis indicates clear peak changes throughout the irradiation process. Copyright © 1994 John Wiley & Sons Ltd. |
