par Terryn, Herman ;Vereecken, Jean
Référence Thin films science and technology, page (747-752)
Publication Publié, 1983
Article révisé par les pairs
Résumé : Depth composition profiles of porous anodized aluminum at different stages of its growth have been obtained by Auger Electron Spectrometry in combination with ion etching. In order to study the growth of this layer, several oxide layers were prepared galvanostatically at different times in sulphuric and phosphoric acid. It has been found that the electrolyte is adsorbed and incorporated into the whole oxide layer during its growth, and that there is an important maximum of this amount incorporated during the transition from barrier to porous layer. (Author abstract. )