• Citer

Thin film analysis of chromium-phosphate conversion coatings on aluminum probed by ToF-SIMS and electron probe X-ray analysis

par Cuynen, Erik;Goeminne, Gudrun;Van Espen, Pierre;Terryn, Herman
Référence Surface and interface analysis, 30, 1, page (589-591)
Publication Publié, 2000-08

Article révisé par les pairs

• Accès en ligne
• Détails
• Contenu
• Statistiques

Résumé :

Time-of-flight SIMS was used to study chromium phosphate conversion layers on Al. During coating formation, fluorine is buried under a layer of CrPxOy as the layer thickens, yielding a duplex layer structure. Electron probe x-ray microanalysis was used to assess the variation in elemental composition of the coating. Preliminary results demonstrate a number of problems related to quantitative analysis of the coatings studied.