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Automatic crystallographic characterization in a transmission electron microscope : Applications to twinning induced plasticity steels and al thin films

par Galceran Mestres, Montserrat ;Albou, Adeline;Renard, Krystel;Coulombier, M.;Jacques, P.J.;Godet, Stéphane
Référence Microscopy and microanalysis, 19, 3, page (693-697)
Publication Publié, 2013

Article révisé par les pairs

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Résumé :

A new automated crystallographic orientation mapping tool in a transmission electron microscope technique, which is based on pattern matching between every acquired electron diffraction pattern and precalculated templates, has been used for the microstructural characterization of nondeformed and deformed aluminum thin films and twinning-induced plasticity steels. The increased spatial resolution and the use of electron diffraction patterns rather than Kikuchi lines make this tool very appropriate to characterize fine grained and deformed microstructures. Copyright © Microscopy Society of America 2013 Â.