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TEM and X-ray diffraction investigation of the structural characteristics of the microporous oxide film formed on polycrystalline Ti

par Gueneau De Mussy Uauy, Jean-Paul ;Langelaan, Gijs;Decerf, Jacqueline ;Delplancke, Jean-Luc
Référence Scripta materialia, 48, 1, page (23-29)
Publication Publié, 2003-01

Article révisé par les pairs

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Résumé :

The microporous TiO2 layer in the vicinity of the Ti-TiO2 interface is formed by a great amount of tiny crystallites. Bigger anatase and rutile crystals stand in the outer region of the oxide. The orientation of a proportion of the TiO2 crystals is influenced by the underlying textured Ti substrate. © 2003 Published by Elsevier Science Ltd. on behalf fo Acta Materialia Inc.