par Afsar, Mohammed Nurul;Kestemont, Edouard 
;Van Loon, Ronald ;Goulon, José;Rivail, Jean Louis;Mandel, Michel ;GÖttman, O.;Kaatze, Udo;Pottel, Reinhard;Kilp, H.;Birch, James J.R.;Chantry, George William;Clarke, Robert Norman;Cook, Raymond R.J.;Jones, Ron Gareth;Rosenberg, Christopher Barry;Bellemans, André ;Finsy, Robert
Référence IEEE transactions on instrumentation and measurement, 29, 4, page (283-288)
Publication Publié, 1980
;Van Loon, Ronald ;Goulon, José;Rivail, Jean Louis;Mandel, Michel ;GÖttman, O.;Kaatze, Udo;Pottel, Reinhard;Kilp, H.;Birch, James J.R.;Chantry, George William;Clarke, Robert Norman;Cook, Raymond R.J.;Jones, Ron Gareth;Rosenberg, Christopher Barry;Bellemans, André ;Finsy, Robert Référence IEEE transactions on instrumentation and measurement, 29, 4, page (283-288)
Publication Publié, 1980
Article révisé par les pairs
| Résumé : | From measurements on hyperpure and commercially pure low- to high-loss liquids over a wide spectral range and using a variety of experimental equipment, we have been able for the first time to quantify both the systematic and the random uncertainties to which extra-high-frequency dielectric measurements are subject. From our measurements it has become possible to specify certain liquids and solids as standard reference materials for the calibration of high-frequency dielectric measuring equipment. Copyright © 1980 by The Institute of Electrical and Electronics Engineers, Inc. |
