par Colinet, Pierre 
;Rednikov, Alexei
Référence ICMF 2010(7: May 30 – June 4, 2010: Tampa, FL), Proceedings of the 7th International Conference on Multiphase Flow
Publication Publié, 2010
;Rednikov, Alexei Référence ICMF 2010(7: May 30 – June 4, 2010: Tampa, FL), Proceedings of the 7th International Conference on Multiphase Flow
Publication Publié, 2010
Publication dans des actes
| Résumé : | The microscale theory of evaporating contact lines is revisited (for the case of a one-component liquid and its pure vapor) in the framework of continuum lubrication-type models allowing the prediction of the apparent contact angle and of the microscale contribution to the heat flux. The analysis is restricted to perfectly flat and homogeneous substrates maintained at constant temperature (at least on the small length scales considered here). Additional physical effects not previously accounted for in the classical theory are discussed, such as the role of the spreading coefficient S∗ often used in studies of wetting of non-volatile liquids, the influence of pressure variations induced by intense flows in the vapor phase, and the modifications brought about by considering small curvatures of the macroscopic meniscus and of the substrate. It is shown that depending on the situation considered, some of these effects (and others, briefly quoted as open questions in the conclusions) might need to be taken into account when numerically modeling macroscopic liquid-vapor flows involving contact lines. |
