par Tam, Enrico ;Peterzhik, M.;Shtansky, Dmitry D.;Delplancke, Marie-Paule
Référence “Seeing at the Nanoscale IV”, International conference exploring nanostructure imaging, characterization and modification using SPM and related techniques (17-20/07/2006: University of Pennsylvania – Philadelphia – USA)
Publication Non publié, 2006-07
Référence “Seeing at the Nanoscale IV”, International conference exploring nanostructure imaging, characterization and modification using SPM and related techniques (17-20/07/2006: University of Pennsylvania – Philadelphia – USA)
Publication Non publié, 2006-07
Poster de conférence
Titre: |
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Auteur: | Tam, Enrico; Peterzhik, M.; Shtansky, Dmitry D.; Delplancke, Marie-Paule |
Informations sur la publication: | “Seeing at the Nanoscale IV”, International conference exploring nanostructure imaging, characterization and modification using SPM and related techniques (17-20/07/2006: University of Pennsylvania – Philadelphia – USA) |
Statut de publication: | Non publié, 2006-07 |
Sujet CREF: | Sciences de l'ingénieur |
Langue: | Anglais |