par Tam, Enrico
;Peterzhik, M.;Shtansky, Dmitry D.;Delplancke, Marie-Paule 
Référence “Seeing at the Nanoscale IV”, International conference exploring nanostructure imaging, characterization and modification using SPM and related techniques (17-20/07/2006: University of Pennsylvania – Philadelphia – USA)
Publication Non publié, 2006-07
;Peterzhik, M.;Shtansky, Dmitry D.;Delplancke, Marie-Paule 
Référence “Seeing at the Nanoscale IV”, International conference exploring nanostructure imaging, characterization and modification using SPM and related techniques (17-20/07/2006: University of Pennsylvania – Philadelphia – USA)
Publication Non publié, 2006-07
Poster de conférence
| Titre: |
|
| Auteur: | Tam, Enrico; Peterzhik, M.; Shtansky, Dmitry D.; Delplancke, Marie-Paule |
| Informations sur la publication: | “Seeing at the Nanoscale IV”, International conference exploring nanostructure imaging, characterization and modification using SPM and related techniques (17-20/07/2006: University of Pennsylvania – Philadelphia – USA) |
| Statut de publication: | Non publié, 2006-07 |
| Sujet CREF: | Sciences de l'ingénieur |
| Langue: | Anglais |



