par McEwen, Jean-Sabin 
;Gaspard, Pierre ;Mittendorfer, Florian;Visart de Bocarmé, Thierry ;Kruse, Norbert
Référence Chemical physics letters, 452, page (133-138)
Publication Publié, 2008-02-04
;Gaspard, Pierre ;Mittendorfer, Florian;Visart de Bocarmé, Thierry ;Kruse, Norbert Référence Chemical physics letters, 452, page (133-138)
Publication Publié, 2008-02-04
Article révisé par les pairs
| Résumé : | The oxidation of nanosized rhodium facets is investigated in the presence of a high external electric field with field ion microscopy experiments (FIM). Corresponding density functional theory (DFT) calculations were done on Rh(001), Rh(011) and Rh(111). A cross-like granular structure is obtained with FIM when the electric field is increased from 11 to 12.3 V/nm, which strongly indicates that the field promotes the oxidation of the tip. The DFT calculations confirm this scenario with a corresponding reduction of the activation barrier for oxygen incorporation into the surface of an oxide layer. |
