par De Schutter, Geert;Abidi, Imene;Korda, Eleni;Boshoff, Billy;Olonade, Kolawole Adisa;Snoeck, Didier 
;Muthukrishnan, Shravan;Zhang, Yiyuan;Tao, Yaxin;Ghodke, Swapnil Balasaheb;Mohan, Manu Kurungod;Yardimci, Mert Yücel;Jiao, Dengwu;Sanjayan, Jay
Référence RILEM Technical Letters, 8, page (198-203)
Publication Publié, 2024-09-18
;Muthukrishnan, Shravan;Zhang, Yiyuan;Tao, Yaxin;Ghodke, Swapnil Balasaheb;Mohan, Manu Kurungod;Yardimci, Mert Yücel;Jiao, Dengwu;Sanjayan, JayRéférence RILEM Technical Letters, 8, page (198-203)
Publication Publié, 2024-09-18
Article révisé par les pairs
| Titre: |
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| Auteur: | De Schutter, Geert; Abidi, Imene; Korda, Eleni; Boshoff, Billy; Olonade, Kolawole Adisa; Snoeck, Didier; Muthukrishnan, Shravan; Zhang, Yiyuan; Tao, Yaxin; Ghodke, Swapnil Balasaheb; Mohan, Manu Kurungod; Yardimci, Mert Yücel; Jiao, Dengwu; Sanjayan, Jay |
| Informations sur la publication: | RILEM Technical Letters, 8, page (198-203) |
| Statut de publication: | Publié, 2024-09-18 |
| Sujet CREF: | Sciences de l'ingénieur |
| Langue: | Anglais |
| Identificateurs: | urn:issn:E234054 |
| info:doi/10.21809/rilemtechlett.2023.200 |
