• Citer

Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals

par Jain, Noopur;Hao, Yansong;Parekh, Urvi;Kaltenegger, Martin ;Pedrazo-Tardajos, Adrián;Lazzaroni, Roberto;Resel, Roland;Geerts, Yves ;Bals, Sara;Van Aert, Sandra
Référence Micron, 169, page (103444)
Publication Publié, 2023

Article révisé par les pairs

• Accès en ligne
• Détails
• Contenu
• Statistiques

Titre:	Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals
Auteur:	Jain, Noopur; Hao, Yansong; Parekh, Urvi; Kaltenegger, Martin; Pedrazo-Tardajos, Adrián; Lazzaroni, Roberto; Resel, Roland; Geerts, Yves; Bals, Sara; Van Aert, Sandra
Informations sur la publication:	Micron, 169, page (103444)
Statut de publication:	Publié, 2023
Sujet CREF:	Chimie
Mots-clés:	Cryogenic temperature
	Electron beam damage
	Electron diffraction
	Graphene
	Lead Phthalocyanine
	Organic crystals
Note générale:	SCOPUS: ar.j
Langue:	Anglais
Identificateurs:	urn:issn:0968-4328
	info:doi/10.1016/j.micron.2023.103444
	info:pii/S0968432823000422
	info:scp/85150810246
	info:pmid/36965270