par Nikolka, Mark;Schweicher, Guillaume 
;Armitage, John;Nasrallah, Iyad;Jellett, Cameron;Guo, Zhijie;Hurhangee, Michael;Sadhanala, Aditya;McCulloch, Iain;Nielsen, Christian B.;Sirringhaus, Henning
Référence Advanced materials, 30, 36, 1801874
Publication Publié, 2018-09-06
;Armitage, John;Nasrallah, Iyad;Jellett, Cameron;Guo, Zhijie;Hurhangee, Michael;Sadhanala, Aditya;McCulloch, Iain;Nielsen, Christian B.;Sirringhaus, HenningRéférence Advanced materials, 30, 36, 1801874
Publication Publié, 2018-09-06
Article révisé par les pairs
| Titre: |
|
| Auteur: | Nikolka, Mark; Schweicher, Guillaume; Armitage, John; Nasrallah, Iyad; Jellett, Cameron; Guo, Zhijie; Hurhangee, Michael; Sadhanala, Aditya; McCulloch, Iain; Nielsen, Christian B.; Sirringhaus, Henning |
| Informations sur la publication: | Advanced materials, 30, 36, 1801874 |
| Statut de publication: | Publié, 2018-09-06 |
| Sujet CREF: | Physique |
| Mots-clés: | charge transport |
| field-effect transistors | |
| organic electronics | |
| stability | |
| Langue: | Anglais |
| Identificateurs: | urn:issn:0935-9648 |
| info:doi/10.1002/adma.201801874 |
