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Asymptotic analysis of the contact-line microregion for a perfectly wetting volatile liquid in a pure-vapor atmosphere

par Rednikov, Alexei ;Colinet, Pierre
Référence Physical Review Fluids, 2, 124006
Publication Publié, 2017-12-27

Article révisé par les pairs

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Résumé :

We revisit the Wayner problem of the microregion of a contact line at rest formed by a perfectly wetting single-component liquid on an isothermal superheated flat substrate in an atmosphere of its own pure vapor. The focus is on the evaporation-induced apparent contact angles. The microregion is shaped by the effects of viscosity, Laplace and disjoining pressures (the latter in the form of an inverse-cubic law), and evaporation. The evaporation is in turn determined by heat conduction across the liquid film, kinetic resistance, and the Kelvin effect (i.e., saturation-condition dependence on the liquid-vapor pressure difference). While an asymptotic limit of large kinetic resistances was considered by Morris nearly two decades ago [J. Fluid Mech. 432, 1 (2001)], here we are concerned rather with matched asymptotic expansions in the limits of weak and strong Kelvin effects. Certain extensions are also touched upon within the asymptotic analysis. These are a more general form of the disjoining pressure and account for the Navier slip. Most notably, these also include the possibility of Wayner's extended microfilms (covering macroscopically dry parts of the substrate) actually getting truncated. A number of isolated cases encountered in the literature are thereby systematically recovered.