par Barroo, Cédric 
;Visart de Bocarmé, Thierry ;Kruse, Norbert
Référence Ecole Doctorale Thématique - chimie (2012: 2012-11-16: Louvain-la-Neuve)
Publication Non publié, 2012-11-16
;Visart de Bocarmé, Thierry ;Kruse, Norbert Référence Ecole Doctorale Thématique - chimie (2012: 2012-11-16: Louvain-la-Neuve)
Publication Non publié, 2012-11-16
Poster de conférence
| Résumé : | Field emission techniques, such as field emission microscopy (FEM) and field ion microscopy (FIM), are used to investigate the dynamics of reactions taking place on the surface of model catalysts (“field emitter tips“). Those studies are made under truly in-situ conditions. Nanometric and even atomic lateral resolution are achieved with these methods and allow to observe the morphological changes of the surface of the catalyst, but also provide an analysis of the local catalytic activity. |
