par Pauly, Nicolas ;Dubus, Alain ;Rösler, Max
Référence Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 193, 1-4, page (414-418)
Publication Publié, 2002-06
Article révisé par les pairs
Résumé : Charge changing processes are known to have a strong influence on ion-induced electron emission characteristics. However, up to now, only a few theoretical models of electron emission incorporate electron capture and loss cross sections. For incident protons with velocities around 1 a.u., a thorough theoretical model of the various charge changing processes undergone by the proton is necessary for a correct description of the electron emission induced by the projectile. Indeed, all the electrons excited in the various processes have to be taken into account. In this work, we consider conduction band Auger capture and loss processes. In particular, we consider plasmon assisted processes, which are not negligible with respect to electron-hole pair assisted Auger processes for electron capture. © 2002 Elsevier Science B.V. All rights reserved.