• Citer

A study of film and foil materials for the GEM detector proposed for the CMS muon system upgrade

par Abbaneo, Duccio;Abbrescia, Marcello;Akl, M. Abi;Armaingaud, C.;Aspell, Paul;Assran, Y.;Bally, S.;Ban, Yong;Banerjee, Sun;Barria, P.;Benussi, Luigi ;Bhopatkar, V;Bianco, S.;Bos, J.;Bouhali, Othmane ;Cai, Jianxin;Calabria, Cesare;Caponero, Michele Arturo;Castaneda, A.;Cauwenbergh, S.;Celik, A.;Christiansen, Jørgen;Colafranceschi, Stefano;Colaleo, Anna;Garcia, Alvaro Conde;De Lentdecker, Gilles ;Oliveira, Rita De Cássia Teixeira;De Robertis, Giuseppe;Dildick, S.;Ferrini, M.;Ferry, Steven;Flanagan, W.;Franchi, A.V.;Gilmore, J.;Gutierrez, Augusto L.;Hoepfner, Kerstin;Hohlmann, Marcus;Kamon, TerukI;Karchin, Paul E.;Khotilovich, Vadim;Krutelyov, Slava;Loddo, F.;Maerschalk, Thierry ;Magazzu, Guido;Maggi, Marcello;Maghrbi, Yasser;Marchioro, Alessandro;Marinov, Alexander;Majumdar, Nayana;Merlin, J.A.;Mukhopadhyay, Supratik;Nuzzo, Salvatore;Oliveri, Eraldo;Passamonti, L.;Philipps, Bernhard;Piccolo, D.;Pierluigi, D.;Postema, Hans;Radi, Abdullah;Radogna, R.;Raffone, Guido;Ranieri, Antonio;Rodrigues, Anna;Ropelewski, Leszek;Russo, Annapina;Safonov, A.;Sakharov, A.;Salva, S.;Saviano, Giovanna;Sharma, Archana;Tatarinov, A.;Teng, Huiling;Turini, N.;Twigger, J.;Tytgat, M.;Van Stenis, Miranda;Verhagen, Erik ;Valente, M.;Yifan, Yang ;Zaganidis, Nicolas;Zenoni, Florian
Référence Journal of Instrumentation, 9, 4, C04022
Publication Publié, 2014-04

Article révisé par les pairs

• Accès en ligne
• Détails
• Contenu
• Statistiques

Titre:	A study of film and foil materials for the GEM detector proposed for the CMS muon system upgrade
Auteur:	Abbaneo, Duccio; Abbrescia, Marcello; Akl, M. Abi; Armaingaud, C.; Aspell, Paul; Assran, Y.; Bally, S.; Ban, Yong; Banerjee, Sun; Barria, P.; Benussi, Luigi; Bhopatkar, V; Bianco, S.; Bos, J.; Bouhali, Othmane; Cai, Jianxin; Calabria, Cesare; Caponero, Michele Arturo; Castaneda, A.; Cauwenbergh, S.; Celik, A.; Christiansen, Jørgen; Colafranceschi, Stefano; Colaleo, Anna; Garcia, Alvaro Conde; De Lentdecker, Gilles; Oliveira, Rita De Cássia Teixeira; De Robertis, Giuseppe; Dildick, S.; Ferrini, M.; Ferry, Steven; Flanagan, W.; Franchi, A.V.; Gilmore, J.; Gutierrez, Augusto L.; Hoepfner, Kerstin; Hohlmann, Marcus; Kamon, TerukI; Karchin, Paul E.; Khotilovich, Vadim; Krutelyov, Slava; Loddo, F.; Maerschalk, Thierry; Magazzu, Guido; Maggi, Marcello; Maghrbi, Yasser; Marchioro, Alessandro; Marinov, Alexander; Majumdar, Nayana; Merlin, J.A.; Mukhopadhyay, Supratik; Nuzzo, Salvatore; Oliveri, Eraldo; Passamonti, L.; Philipps, Bernhard; Piccolo, D.; Pierluigi, D.; Postema, Hans; Radi, Abdullah; Radogna, R.; Raffone, Guido; Ranieri, Antonio; Rodrigues, Anna; Ropelewski, Leszek; Russo, Annapina; Safonov, A.; Sakharov, A.; Salva, S.; Saviano, Giovanna; Sharma, Archana; Tatarinov, A.; Teng, Huiling; Turini, N.; Twigger, J.; Tytgat, M.; Van Stenis, Miranda; Verhagen, Erik; Valente, M.; Yifan, Yang; Zaganidis, Nicolas; Zenoni, Florian
Informations sur la publication:	Journal of Instrumentation, 9, 4, C04022
Statut de publication:	Publié, 2014-04
Sujet CREF:	Physique des particules élémentaires
Mots-clés:	Detection of defects
	Manufacturing
	Materials for gaseous detectors
	Muon spectrometers
Note générale:	SCOPUS: ar.j
Langue:	Anglais
Identificateurs:	urn:issn:1748-0221
	info:doi/10.1088/1748-0221/9/04/C04022
	info:scp/84899547310