par Dubus, Alain ;Rösler, Max
Référence Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 125, 1-4, page (18-22)
Publication Publié, 1997-04
Article révisé par les pairs
Résumé : Charge state effects are known to be important for particle induced electron emission. Indeed, the charge state of the incident beam has a strong effect on the emission yields. Incident neutral hydrogen atoms can induce secondary electrons after an electron loss process. At high impact energies (above 200 keV) target electrons are excited by both the proton and the electron which can be treated in a first approximation as independent "primary particles". A more precise description should include different microscopic processes: (i) target electron excitation by the undissociated neutral H0; (ii) excitation of the projectile electron by the loss process accompanied by target electron excitation; (iii) excitation of target electrons by the proton and the electron. At high impact energies it is justified to neglect the capture processes. It is the aim of this paper to calculate the electron emission characteristics of aluminum including all these processes. The various microscopic processes are incorporated in a Monte Carlo simulation code.