par Swaminathan, S.;Capel, Pierre ;Smidts, Carol-Sophie
Editeur scientifique Smidts, Carol-Sophie ;Devooght, Jacques ;Labeau, Pierre-Etienne
Référence International workshop series on advanced topics in reliability and risk analysis(5: September 1998: University of Maryland, College Park, USA), Dynamic reliability : future directions, The Center for Reliability Engineering, College Park, Maryland, page (77–99)
Publication Publié, 2000
Publication dans des actes
Titre:
  • A semi-analytical approach to the solution of event sequence diagrams
Auteur:Swaminathan, S.; Capel, Pierre; Smidts, Carol-Sophie
Editeur scientifique:Smidts, Carol-Sophie; Devooght, Jacques; Labeau, Pierre-Etienne
Informations sur la publication:International workshop series on advanced topics in reliability and risk analysis(5: September 1998: University of Maryland, College Park, USA), Dynamic reliability : future directions, The Center for Reliability Engineering, College Park, Maryland, page (77–99)
Statut de publication:Publié, 2000
Sujet CREF:Sciences de l'ingénieur
Processus stochastiques
Langue:Anglais
Identificateurs:urn:isbn:9780965266932
VX-004446