par Dubus, Alain 
;Devooght, Jacques ;Dehaes, Jean-Claude
Référence Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 13, 1-3, page (623-626)
Publication Publié, 1986-03
;Devooght, Jacques ;Dehaes, Jean-Claude Référence Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 13, 1-3, page (623-626)
Publication Publié, 1986-03
Article révisé par les pairs
| Résumé : | Theoretical predictions of three electron transport models are compared for H+ induced secondary electron emission from Al. In particular, the secondary electron energy distribution and the ion energy dependence of the secondary electron yield have been obtained. For thin targets, we have calculated the forward and backward electron yields as well as their dependence upon the angle of incidence of the ions. Our results are in agreement with the presently available experimental data. However, further work is needed to describe adequately the thin foil results. © 1986. |
