Articles dans des revues avec comité de lecture (154)
  1. 116. Reniers, F. (2008). Surface and Interface Analysis: Preface. Surface and interface analysis, 40(3-4), 126-127. doi:10.1002/sia.2858
  2. 117. Batan, A., Franquet, A., Vereecken, J., & Reniers, F. (2008). Characterisation of the silicon nitride thin films deposited by plasma magnetron. Surface and interface analysis, 40(3-4), 754-757. doi:10.1002/sia.2730
  3. 118. Demoisson, F., Raes, M., Terryn, H., Guillot, J., Migeon, H., & Reniers, F. (2008). Characterization of gold nanoclusters deposited on HOPG by atmospheric plasma treatment. Surface and interface analysis, 40(3-4), 566-570. doi:10.1002/sia.2709
  4. 119. Timmermans, B., Reniers, F., Weightman, P., & Vaeck, N. (2007). Auger and photoelectron relaxation energy in aluminum compounds: A cluster model. Journal of electron spectroscopy and related phenomena, 159(1-3), 1-7. doi:10.1016/j.elspec.2007.01.004
  5. 120. Vandencasteele, N., Merche, D., & Reniers, F. (2006). XPS and contact angle study of N2 and O2 plasma-modified PTFE, PVDF and PVF surfaces. Surface and interface analysis, 38(4), 526-530. doi:10.1002/sia.2255
  6. 121. Vandencasteele, N., Fairbrother, H., & Reniers, F. (2005). Selected effect of the ions and the neutrals in the plasma treatment of PTFE surfaces: An OES-AFM-contact angle and XPS study. Plasma processes and polymers, 2(6), 493-500. doi:10.1002/ppap.200500010
  7. 122. Vandencasteele, N., Fairbrother, H., & Reniers, F. (2005). Selected effect of the ions and the neutrals in the Plasma treatment of PTFE surfaces: An OES-AFM-contact angle and XPS ctudy. Plasma processes and polymers, 2(6), 493-500. doi:10.1002/ppap.200500010
  8. 123. Reniers, F., & Tewell, C. (2005). Review: New Improvements in Energy and spatial (x,y,z) resolution in AES and XPS applications. Journal of electron spectroscopy and related phenomena, 142, 1-25.
  9. 124. Vandendael, I., Steenhaut, O., Hubin, A., Vereecken, J., Prince, P., Reniers, F., & Segato, T. (2004). AES analysis of nitride layers on steel with target factor analysis. Surface and interface analysis, 36(8), 1093-1097. doi:10.1002/sia.1848
  10. 125. Timmermans, B., Hubin, A., Vaeck, N., & Reniers, F. (2004). Experimental and theoretical study of CVV Auger peaks of selected aluminium and carbon compounds. Surface and interface analysis, 36(8), 798-800. doi:10.1002/sia.1767
  11. 126. Vandencasteele, N., & Reniers, F. (2004). Surface characterization of plasma-treated PTFE surfaces: An OES, XPS and contact angle study. Surface and interface analysis, 36(8), 1027-1031. doi:10.1002/sia.1829
  12. 127. Pace, S., Van Hoof, T., Hou, M., Buess Herman, C., & Reniers, F. (2004). Surface composition of CuAu single crystal electrodes determined by coupled UHV-electrochemical approach and a Monte Carlo Simulation. Surface and Interface Analysis, 36(8), 1078-1082. doi:10.1002/sia.1845
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