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Dielectric resonator for measuring the magnetic penetration depth at low temperature in high-Tc superconducting thin films

par Mourachkine, Andrei
Référence Review of scientific instruments, 66, 11, page (5282-5287)
Publication Publié, 1995

Article révisé par les pairs

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Résumé :

Knowledge of magnetic penetration depth λ(T) at low temperatures allows one to determine the pairing state in the superconductors. A simple method for the evaluation of λ(T) of small (∼1 cm×∼1 cm), flat, high-Tc superconductive samples at low T is discussed. The resolution of the method is a few Å. In addition to high resolution, the method has several advantages including nondestructive analysis, flexibility in sample size, and minimal requirements on the dielectric resonator. The current distribution within the sample being tested can also be accurately calculated, the experimental setup is convenient, and the procedure is comparatively rapid and can be performed in the necktube of a liquid-helium storage Dewar. The measurements for YBCO thin films have been performed at 14.4 GHz. © 1995 American Institute of Physics.