par Ku, Bon Woong;Debacker, Peter;Milojevic, Dragomir ;Raghavan, Praveen;Verkest, Diederik ;Thean, Aaron;Lim, Sung Kyu
Référence Proceedings of the 2016 International Symposium on Low Power Electronics and Design, ACM, page (76-81)
Publication Publié, 2016-08-01
Référence Proceedings of the 2016 International Symposium on Low Power Electronics and Design, ACM, page (76-81)
Publication Publié, 2016-08-01
Publication dans des actes
Titre: |
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Auteur: | Ku, Bon Woong; Debacker, Peter; Milojevic, Dragomir; Raghavan, Praveen; Verkest, Diederik; Thean, Aaron; Lim, Sung Kyu |
Informations sur la publication: | Proceedings of the 2016 International Symposium on Low Power Electronics and Design, ACM, page (76-81) |
Statut de publication: | Publié, 2016-08-01 |
series: | ISLPED '16 |
Sujet CREF: | Technologie informatique hardware |
Technol. des composantes électroniques [microélectronique] | |
Mots-clés: | FEOL/BEOL Degradation, Gate-level Monolithic 3D IC, Low Temperature Manufacturing Process |
Langue: | Anglais |
Identificateurs: | urn:isbn:978-1-4503-4185-1 |
info:doi/10.1145/2934583.2934622 | |
http://doi.acm.org/10.1145/2934583.2934622 |