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Caractérisation de polymères par analyse infrarouge à l’échelle nanométrique

par Waeytens, Jehan ;Doneux, Thomas
Référence Chimie nouvelle, 123, page (8-16)
Publication Publié, 2016

Article révisé par les pairs

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Résumé :

AFM-IR is a recent technique based on the detection of IR absorption by the tip of an AFM. It provides local spectroscopic information at subdiffraction resolution. In this work, model samples made of polystyrene thin films, as well as commercial multilayer packaging films have been characterised by AFM-IR. Infrared spectra with sufficient signal to-noise ratio (S/N) were recorded in a single scan for thicknesses down to 30 nm. Increasing the number of scans, and hence the S/N, thinner samples (16 nm) could be analysed. AFM-IR is particularly powerful for multilayer samples, and it was possible to identify the chemical nature of each layer in the commercial sample, as well as the typical interfacial thickness between each layer. A value of 600 nm was determined, which would have been inaccessible by conventional IR microscopy. In addition to topographic and spectroscopic information, it is proposed on an experimental basis that the deflection profile of the AFM tip upon relaxation from the photothermally induced resonance could be used to extract some viscoelastic properties of the sample, by analogy with the widespread contact resonance AFM.