par Barroo, Cédric ;Visart de Bocarmé, Thierry ;Kruse, Norbert
Référence Assemblée générale de l'ASBL Nanowal (2012-04-03: Bruxelles)
Publication Non publié, 2012-04-03
Poster de conférence
Résumé : Field effects techniques, such as field emission microscopy (FEM) and field ion microscopy (FIM), are used to investigate the dynamics of reactions taking place on the surface of model catalysts (“field emitter tips“). Those studies are made under truly in-situ conditions. Nanometer resolution is achieved with these methods and allows to observe the morphological changes of the catalyst’s surfaces, but also provides an analysis of the local catalytic activity.