Résumé : This thesis is dedicated to the study of the interaction between a gas jet and a liquid film on a moving surface. This flow configuration corresponds to the gas-jet wiping technique, which is widely used in the coating industry to reduce and control the thickness of a liquid film dragged by a moving substrate. For that purpose, a turbulent slot jet impinges on the liquid surface, involving a runback flow and consequently a lower coating thickness downstream wiping. The different process parameters (nozzle pressure, nozzle to substrate standoff distance, slot width, substrate speed) allow controlling the final film thickness. This metering technique is very common in coating processes, such as the application of gelatin layers on photographic films.

The first part of this thesis deals with the prediction of the mean jet wiping flow, i.e. the film thickness distribution in the wiping region. A lubrication model is developed for that purpose, which is simplified to a zero-dimensional model giving directly the final thickness

In the second part, the prediction of splashing occurrence in jet wiping is addressed. The splashing phenomenon in jet wiping is featured by the ejection of droplets from the runback flow, and it constitutes a physical limit to the process. An experimental investigation is conducted on a water model facility, and based on a phenomenological description, a dimensionless correlation in terms of film Reynolds number and jet Weber number is derived for splashing occurrence. The latter is perfectly well validated with observations on industrial lines.

The last part of this thesis is dedicated to the study of the unsteady phenomena occurring on the free surface of the liquid film downstream wiping. This phenomenon has never been understood nor characterized up to now. In the present research, undulation is investigated both theoretically and experimentally. Two model test facilities with dedicated measurement techniques have been designed and constructed. They allow performing parametric studies of the undulation characteristics (amplitude, wavelength, wave velocity), and analyzing the jet/film interaction.