• Citer

Photonic force microscopy with back-scattered light

par Volpe, Giovanni;Kozyreff, Gregory ;Petrov, Dmitri
Référence Optics InfoBase Conference Papers
Publication Publié, 2007

Article révisé par les pairs

• Détails
• Contenu

Résumé :

We compare the sensitivity of the Photonic Force Microscope for the forward-scattering and backwardscattering geometries, calculating the total-scattered electromagnetic field from a dielectric bead in an optical trap using a Mie-Debye approach. © 2006 Optical Society of America.