par Charlier, Jacques 
Référence Proceedings of SPIE - The International Society for Optical Engineering, 349, page (2-21)
Publication Publié, 1982
Référence Proceedings of SPIE - The International Society for Optical Engineering, 349, page (2-21)
Publication Publié, 1982
Article révisé par les pairs
| Résumé : | All the non destructive methods based on ionizing radiation detect the defects thanks to difference of absorption. There is a lot of progress to ameliorate the contrast, the sharpness and also the localization of the defect but the information is always a function of the thickness of the defect. For volumic defect this method cannot be substituted but for defect with two dimensions if the thickness parallel to the surface the radiography cannot bring any information. That is the true limit of the radiography. |
