par Mourachkine, Andrei ;Barel, Alain R F
Référence Microwave journal, 38, 4, page (7)
Publication Publié, 1995-04
Article révisé par les pairs
Résumé : Dielectric resonators are widely used in microwave circuits due to their small size, low loss and high stability. Knowledge of the temperature dependence of the properties of dielectric resonators can be as important as precise knowledge of the properties themselves. A parallel-plate dielectric resonator method is used to determine the temperature dependence of the fr resonant frequency, the εr relative permittivity, the tan δ loss tangent, and the τf and τε temperature coefficients of dielectric resonators in a broad temperature range.