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In-plane rotation analysis by two-wavelength electronic speckle interferometry

par Nassim, Abdel-Karim;Joannes, Luc ;Cornet, Alain
Référence Applied optics, 38, 12, page (2467-2470)
Publication Publié, 1999-04

Article révisé par les pairs

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Résumé :

A simple method is presented for the measurement of in-plane rotation (angle and sign) of an object by use of the conventional in-plane sensitive electronic speckle pattern interferometry technique combined with the two-wavelength laser diode method. The advantage of this method is that it can be used to measure the angle of rotation in a simple way by determination of fringe tilt. The experimental setup is described, and results are presented. © 1999 Optical Society of America.