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Polarization and dipole effects in hard X-ray photoelectron spectroscopy

par Novak, Mihaly ;Pauly, Nicolas ;Dubus, Alain
Référence Journal of electron spectroscopy and related phenomena, 185, page (4-12)
Publication Publié, 2012

Article révisé par les pairs

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Résumé :

Hard X-ray photoelectron spectroscopy (HXPS) using X-rays in the 1.5-15 keV energy range generated by synchrotron sources becomes an increasingly important analysis technique due to its potential for bulk sensitive measurements. However, besides their high energy, another characteristic of photons generated by synchrotron sources is their linear polarization while X-rays from Al Kα or Mg Kα for instance are unpolarized. This difference implies a possible variation in total path travelled by the photoelectrons generated by the X-rays inside the medium and consequently a modification of the resulting spectrum shape. We show the influence of the polarization on the partial intensity distributions, namely the number of electrons escaping after n inelastic scattering events, for photoelectron with energies of 0.5, 1, 2, 3, 4 and 5 keV and originating from Si 1s 1/2, Cu 1s 1/2, Cu 2p 3/2, Au 4d 3/2 and Au 4f 7/2 subshells. Moreover, we point out the influence of the dipole approximation leading to an underestimation of the partial intensity distributions due to the neglect of the forward-backward asymmetry of the angular photoelectron distribution. © 2011 Elsevier B.V. All rights reserved.